Imaging Modes

The PEEM imaging modes can vary depending on the illumination source, the imaging kinetic energy (when an analyzer is available) and the imaged plane (image, diffraction or energy-dispersive plane).

Work function contrast can be observed when using a low photon energy source such as a mercury short-arc lamp with photon energies of ≈ 5 eV.

With a tunable photon energy source, XAM measurements can be performed. A relevant case is the use of circularly polarized x-rays to obtain the magnetic contrast or XMCD-PEEM.

XPEEM images can be obtained by using the imaging energy analyzer on our PEEM III or SPELEEM to resolve the chemical composition at a high lateral resolution.

Furthermore, the projection of the PED pattern on the detector allows direct band mapping by the direct imaging of the full k||-space at once.

Please feel free to click on the pictures in the sidepanel to enlarge them.

Magnetic contrast

120 nm thick MnAs film on GaAs(100). FoV 20 Ám. (Courtesy of R. Belkhou)