Direct surface imaging microscope


System description:

The PEEM III system is an extremely simple, compact and productive instrument. Due to its straight column, the alignment takes only a few minutes so that students or users can focus on their research. The microscope is versatile and can host up to 8 evaporators or light sources. Its installation at a synchrotron can be very useful for high spatial resolution XAS measurements. Moreover, synchrotron measurements can be performed while growing a film. The installation, refill or exchange of evaporators requires only a short bake out and degassing of the evaporator filaments.

An important possible upgrade for the PEEM III is an imaging energy analyzer.

Please contact us for more information or visit our components page for exchange parts and upgrades.