LEEM III
Direct surface imaging microscope
System description:
The LEEM III system is highly compact and offers high scientific flexibility. The direct real-time imaging of crystal surfaces enables dynamic studies of growth, decomposition, melting, phase transition processes and diffusion on surfaces. The system is simple to use and, with its advanced computer control, easy to align. This enables users to make the most out of their research time.
The LEEM III can also be upgraded using several components to even expand its capabilities. A spin-polarized electron gun can be used for fast magnetic domain imaging with high lateral resolution.
The imaging energy analyzer can be added to resolve the kinetic energy of the photo-emitted electrons and perform XPEEM, e.g. with a He-plasma discharge light source (hv≈21 eV) or a focused laboratory X-ray source.
Please contact us for more information or visit our components page for exchange parts and upgrades.
